39 lines
1.3 KiB
Plaintext
Executable File
39 lines
1.3 KiB
Plaintext
Executable File
About the Tests
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The following tests are from the original version, updated simply for speed
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and rewritten to fit the new framework of the program. These tests will
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mainly catch memory errors due to bad bits which are permanently stuck high
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or low:
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Random value
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XOR comparison
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SUB comparison
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MUL comparison
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DIV comparison
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OR comparison
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AND comparison
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The following tests were implemented by me, and will do a slightly better job
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of catching flaky bits, which may or may not hold a true value:
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Sequential Increment
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Block Sequential
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Solid Bits
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The remaining tests were also implemented by me, and are designed to catch
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bad bits which are dependent on the current values of surrounding bits in either
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the same word32, or in the preceding and succeeding word32s.
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Bit Flip
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Checkerboard
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Walking Ones
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Walking Zeroes
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Bit Spread
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There is also a test (Stuck Address) which is run first. It determines if the
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memory locations the program attempts to access are addressed properly or not.
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If this test reports errors, there is almost certainly a problem somewhere in
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the memory subsystem. Results from the rest of the tests cannot be considered
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accurate if this test fails:
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Stuck Address
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Usage information is summarized in the file README, and in the man page.
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